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    Automated TEM Analysis Platform

    Imec EU Pilot line NV

    Automated TEM Analysis Platform

    1. Contract signed

      Aug 13, 12:00 AMAugust 13, 2026 12:00 AM

    2. Result notice published

      Sep 29, 8:00 PMSeptember 29, 2026 8:00 PM

    Brief

    Belgium: Tenders/Imec EU Pilot line NV/Automated TEM Analysis Platform

    Awarded

    The competition has ended and a winner has been selected.

    Brief

    Imec EU Pilot line NV has entered into an agreement with FEI EUROPE BV for the supply and commissioning of two 300 mm full wafer automated TEM sample preparation tools. These tools are required to load 300mm wafers and perform high-accurate automated TEM sample preparation, including full automated preparation of quality and ultra-thin samples (sub 20nm) with nanometer-range precision for automated end-pointing on specific structures. In-system gas injection for carbon, TEOS, and tungsten deposition is also required. The delivery will take place in Arr. Leuven. Only one bid was received for this contract.

    Result

    Winner
    FEI EUROPE BV
    Number of bids
    1
    Contract value
    €0

    About the bid

      The object of this tender is the supply and commissioning of 2 300 mm full wafer automated TEM sample preparation tool. Both tools should be able to load 300mm wafers and allow for high-accurate automate TEM sample preparation. Both tools should be able to do full automated sample preparation of quality and ultra-thin samples (sub 20nm). Automated end-pointing of the TEM sample needs to be precise within nanometer range on a specific structure. In-system gas injection for carbon, TEOS and tungsten deposition is required.

      Contact phone
      +32 16287789
      Contact email
      tom.wauters@imec.be
      Address
      Kapeldreef 75, 3001 Heverlee

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    • Description

      See tender documents

    Qualification requirements

      Found no qualification requirements in the contract notice.

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    See the full notice

    Contracting authority
    Imec EU Pilot line NV
    Title
    Automated TEM Analysis Platform
    Type
    ResultPrequalification
    Main code
    38000000Laboratory, optical and precision equipments (excl. glasses)
    Supplemental codes

    No supplemental codes from buyer…

    Supplemental codes added by Cobrief

    38432000Analysis apparatus
    38511000Electron microscopes
    38511200Transmission electron microscope
    Location
    Arr. Leuven

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