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    WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

    Imec EU Pilot line NV

    WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

    1. Competition notice published

      Jun 2, 8:00 PMJune 2, 2026 8:00 PM

    2. Qualification deadline

      Jul 6, 11:30 AMJuly 6, 2026 11:30 AM

    Brief

    Belgium: Tenders/Imec EU Pilot line NV/WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

    Published deadline passed

    The published deadline has passed. For multi-stage competitions a later tender deadline may still apply — check the notice or portal for the current phase.

    Brief

    Laboratorie-, optisk- og presisjonsutstyr

    Imec EU Pilot line NV heeft een WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM nodig. Dit betreft de levering van laboratorium-, optische en precisieapparatuur.

    About the bid

      WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM

      Contact phone
      +32 16287789
      Contact email
      tom.wauters@imec.be
      Address
      Kapeldreef 75, 3001 Heverlee

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    See the full notice

    Contracting authority
    Imec EU Pilot line NV
    Title
    WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
    Type
    CompetitionPrequalification
    Main code
    38000000Laboratory, optical and precision equipments (excl. glasses)
    Supplemental codes

    No supplemental codes from buyer…

    Supplemental codes added by Cobrief

    38511000Electron microscopes
    38511100Scanning electron microscopes
    38512100Ion microscopes
    Location
    Arr. Leuven

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