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    FAB FIB SEM

    Imec EU Pilot line NV

    FAB FIB SEM

    1. Result notice published

      Oct 26, 10:00 PMOctober 26, 2025 10:00 PM

    2. Questions deadline

      Jan 20, 11:00 AMJanuary 20, 2026 11:00 AM

    3. Tender submission deadline

      Feb 3, 11:00 AMFebruary 3, 2026 11:00 AM

    4. Contract start date

      Apr 30, 10:00 PMApril 30, 2026 10:00 PM

    5. Tender validity period

      May 3, 10:00 AMMay 3, 2026 10:00 AM

    Brief

    Belgium: Tenders/Imec EU Pilot line NV/FAB FIB SEM

    Awarded

    The competition has ended and a winner has been selected.

    Brief

    Laboratorie-, optisk- og presisjonsutstyr

    Imec EU Pilot line NV heeft een overeenkomst gesloten met FEI EUROPE BV - Branch Belgium voor de levering van een 300mm wafer ultra-hoge resolutie focused ion beam scanning elektronenmicroscoop (FIB-SEM) systeem. Het systeem moet nanometer-schaal beeldvorming van een dwarsdoorsnede en de voorbereiding van nauwkeurig gelokaliseerde en dunne TEM lamellen mogelijk maken, met een vereiste dikte van minder dan 30nm. Het apparaat moet 300mm wafers kunnen laden en meerdere TEM-roosters op het podium kunnen plaatsen, met in-systeem gasinjectie voor koolstof- en wolfraamafzetting. Automatisering voor dwarsdoorsnede-analyse en TEM-monstervoorbereiding is vereist. De levering vindt plaats in Arr. Leuven. Er was één inschrijver.

    Result

    Winner
    FEI EUROPE BV - Branch Belgium
    Number of bids
    1
    Contract value
    €0

    About the bid

      We are looking for a 300mm wafer ultra-high resolution focused ion beam scanning electron microscope (FIB-SEM) system. The tool should allow for nanometer scale imaging of a cross-section and preparation of precise located and thin TEM lamellae. End-pointing of the cross section as well as location for the TEM lamella needs to be precise within nanometer range on a specific structure. Final achieved thickness of TEM lamella Is required below 30nm to provide minimal overlap within lamella thickness, while still being crystalline and uncontaminated, ready for TEM inspection. The tool needs to be able to load 300mm wafers and have a possibility to load multiple TEM grids on the stage. Grid position needs to allow for lamella preparation in multiple orientations. In-system gas injection for carbon and tungsten deposition is required. In order to increase speed for our current workflow, the tool needs to be able to use automation to perform cross-section analysis and prepare TEM specimen.

      Contact phone
      +32 16287789
      Contact email
      tom.wauters@imec.be
      Address
      Kapeldreef 75, 3001 Heverlee

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    Award Criteria

    • Description

      See tender documents

    Qualification requirements

      Found no qualification requirements in the contract notice.

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    See the full notice

    Contracting authority
    Imec EU Pilot line NV
    Title
    FAB FIB SEM
    Type
    ResultPrequalification
    Main code
    38000000Laboratory, optical and precision equipments (excl. glasses)
    Supplemental codes

    No supplemental codes from buyer…

    Supplemental codes added by Cobrief

    38511000Electron microscopes
    38511100Scanning electron microscopes
    38512100Ion microscopes
    Location
    Arr. Leuven

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