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    Kelvin probe force microscopy (KPFM)

    TEKNOLOGIAN TUTKIMUSKESKUS VTT OY

    Kelvin probe force microscopy (KPFM)

    1. Competition notice published

      Feb 18, 11:26 AMFebruary 18, 2026 11:26 AM

    2. Contract signed

      Sep 10, 12:00 AMSeptember 10, 2026 12:00 AM

    3. Result notice published

      Sep 11, 7:43 AMSeptember 11, 2026 7:43 AM

    Brief

    Finland: Tenders/TEKNOLOGIAN TUTKIMUSKESKUS VTT OY/Kelvin probe force microscopy (KPFM)

    Awarded

    The competition has ended and a winner has been selected.

    Award
    Quality 50%
    Procedure
    OpenSingle stage
    Agreement
    Buying goodsover 6 months

    Brief

    VTT Technical Research Centre of Finland Ltd has entered into an agreement with Concept Scientific Instruments for the delivery of a Kelvin probe force microscopy (KPFM) system, equipped with atomic force microscopy (AFM) functionality, to be delivered in Helsinki-Uusimaa. The contract has a duration of 6 months and a value of 177,100 €. The required equipment supports both AM- and FM-KPFM modes, operates with a potential range up to ±10 V, and includes integrated cooling and heating control from -30°C to +90°C for in-situ studies. One bid was received for this contract.

    Laboratorie- og analyseutstyr

    Result

    • Concept Scientific Instruments
      Winner
    • Number of bids
      1
    • Contract value
      €177,100

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    • Description

      The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender.

      Source

      No source found in the documents. Check the weight against the tender documents.

    • Description

      The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender.

      Source

      No source found in the documents. Check the weight against the tender documents.

    Previous winners

    • Who are you up against?

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    From the notice

    • The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents.Main features of the procedureThe tender process was based on the open procedure applicable to contracts that exceed the EU procurement threshold.

    • Contact

      VTT Technical Research Centre of Finland Ltdkilpailutus@vtt.fi
    • Type
      Result
    • Location
      Helsinki-Uusimaa
    • Main code
      Measuring instruments
      38300000

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