Semi-automatic prober for characterization of 200 mm wafers

IHP GmbH - Leibniz-Institut für innovative Mikroelektronik needs a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system should support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and integrate with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training, and integration support. The delivery, installation, commissioning, and integration will take place in Frankfurt (Oder), Germany.

Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers

IHP GmbH - Lebniz-Institut für innovative Mikroelektronik needs a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use. The system, to be delivered to Frankfurt (Oder), Kreisfreie Stadt, Germany, must include a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measurements up to at least 6 GHz, a probe card system, automated microscopy and camera equipment, as well as control and software components. The scope of supply also includes transport, installation, commissioning, training, documentation, warranty, and spare-parts supply.

Wafer Burn In Test (ENAS-11.1.3) - PR1212932-3340-P

Die Fraunhofer-Gesellschaft - Einkauf B12 benötigt Lieferungen für einen Wafer Burn In Test (ENAS-11.1.3) in Chemnitz, Kreisfreie Stadt. Eles Semiconductor Equipment S.P.A. hat heute ähnliche Verträge. Als Qualifikationsanforderung wird der Umsatz der letzten 3 Geschäftsjahre herangezogen.